Browsing by author "Kambham, Ajay Kumar"
Now showing items 21-27 of 27
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field evaporation behavior of high-k metal gate stack under femtosecond laser pulsing
Gilbert, Matthieu; Koelling, Sebastian; Kambham, Ajay Kumar; Vandervorst, Wilfried (2010) -
High performance n-mos FinFET by damage-free, conformal extension doping
Zschaetzsch, Gerd; Sasaki, Y.; Hayashi, S.; Togo, Mitsuhiro; Chiarella, Thomas; Kambham, Ajay Kumar; Mody, J.; Douhard, Bastien; Horiguchi, Naoto; Mizuno, B.; Ogura, M.; Vandervorst, Wilfried (2011) -
In-situ observation of non-hemispherical tip shape formation during laser-assisted Atom Probe Tomography
Koelling, Sebastian; Gilbert, Matthieu; Kambham, Ajay Kumar; Innocenti, Nicolas; Vandervorst, Wilfried (2010) -
Junction strategies for 1x nm technology node with FINFET and high mobility channel
Horiguchi, Naoto; Zschaetzsch, Gerd; Sasaki, Yuichiro; Kambham, Ajay Kumar; Douhard, Bastien; Togo, Mitsuhiro; Hellings, Geert; Mitard, Jerome; Witters, Liesbeth; Eneman, Geert; Noda, Taiji; Collaert, Nadine; Vandervorst, Wilfried; Thean, Aaron (2012) -
Scanning Spreading Resistance Microscopy for carrier profiling beyond 32nm node
Mody, Jay; Zschaetzsch, Gerd; Koelling, Sebastian; De Keersgieter, An; Eneman, Geert; Kambham, Ajay Kumar; Drijbooms, Chris; Schulze, Andreas; Chiarella, Thomas; Horiguchi, Naoto; Eyben, Pierre; Vandervorst, Wilfried (2012) -
Specifics of cross-section analyses on semiconductor multi-layers
Koelling, Sebastian; Gilbert, Matthieu; Innocenti, Nicolas; Kambham, Ajay Kumar; Vandervorst, Wilfried (2010) -
Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomography
Kambham, Ajay Kumar; Kumar, Arul; Florakis, Antonios; Vandervorst, Wilfried (2013)