Browsing by author "Chen, Shih-Hung"
Now showing items 21-40 of 109
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Emerging challenges of ESD protections in FinFET technologies
Chen, Shih-Hung; Linten, Dimitri; Hellings, Geert; Scholz, Mirko; Groeseneken, Guido (2013) -
ESD ballasting of Ge Finfet ggNMOS devices
Boschke, Roman; Chen, Shih-Hung; Scholz, Mirko; Hellings, Geert; Linten, Dimitri; Witters, Liesbeth; Collaert, Nadine; Groeseneken, Guido (2017) -
ESD challenges in advanced FinFET and GAA nanowire CMOS technologies
Chen, Shih-Hung (2019) -
ESD challenges in advanced FinFET and GAA nanowire CMOS technologies
Chen, Shih-Hung (2018) -
ESD Challenges in sub-10nm CMOS technologies
Chen, Shih-Hung; Linten, Dimitri; Scholz, Mirko; Hellings, Geert; Boschke, Roman; Horiguchi, Naoto (2016) -
ESD characterization of a-IGZO TFTs on Si and foil substrates
Wang, Nian; Chen, Shih-Hung; Hellings, Geert; Myny, Kris; Steudel, Soeren; Scholz, Mirko; Boschke, Roman; Linten, Dimitri; Groeseneken, Guido (2017) -
ESD characterization of gate-all-around (GAA) Si nanowire devices
Chen, Shih-Hung; Hellings, Geert; Linten, Dimitri; Veloso, Anabela; Scholz, Mirko; Boschke, Roman; Groeseneken, Guido; Thean, Aaron (2015) -
ESD characterization of germanium ESD devices
Boschke, Roman; Linten, Dimitri; Hellings, Geert; Chen, Shih-Hung; Scholz, Mirko; Mitard, Jerome; Mertens, Hans; Witters, Liesbeth; Van Campenhout, Joris; Verheyen, Peter; Pogany, Dionyz; Groeseneken, Guido (2014-09) -
ESD characterization of germanium FinFET diodes and ggMOS
Boschke, Roman; Linten, Dimitri; Chen, Shih-Hung; Scholz, Mirko; Hellings, Geert; Mitard, Jerome; Witters, Liesbeth; Groeseneken, Guido (2015) -
ESD characterization of hgh mobility SiGe quantum well and Ge devices for future CMOS scaling
Hellings, Geert; Linten, Dimitri; Thijs, Steven; Chen, Shih-Hung; Witters, Liesbeth; Mitard, Jerome; Groeseneken, Guido (2012) -
ESD characterization of high mobility SiGe quantum well and Ge devices for future CMOS scaling
Hellings, Geert; Linten, Dimitri; Thijs, Steven; Chen, Shih-Hung; Witters, Liesbeth; Mitard, Jerome; Zografos, Odysseas; Groeseneken, Guido (2012) -
ESD characterization of planar InGaAs devices
Ji, Zhigang; Linten, Dimitri; Boschke, Roman; Hellings, Geert; Chen, Shih-Hung; Alian, AliReza; Zhou, Daisy; Mols, Yves; Ivanov, Tsvetan; Franco, Jacopo; Kaczer, Ben; Zhang, X.; Gao, R.; Zhang, J.F.; Zhang, W.; Collaert, Nadine; Groeseneken, Guido (2015) -
ESD consideration on 3D stacking integrated circuits constructed with through-silicon-via (TSV) and micro-bump structures
Linten, Dimitri; Chen, Shih-Hung (2012-07) -
ESD diodes in Bulk Si gate-all-around vertically stacked horizontal nanowire technology
Chen, Shih-Hung; Hellings, Geert; Scholz, Mirko; Linten, Dimitri; Mertens, Hans; Ritzenthaler, Romain; Boschke, Roman; Groeseneken, Guido; Horiguchi, Naoto (2016) -
ESD diodes in next generation bulk FinFET and GAA NW technology nodes
Chen, Shih-Hung; Hellings, Geert; Linten, Dimitri; Mertens, Hans; Chiarella, Thomas; Mitard, Jerome; Mocuta, Anda; Horiguchi, Naoto (2018) -
ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology
Simicic, Marko; Hellings, Geert; Chen, Shih-Hung; Horiguchi, Naoto; Linten, Dimitri (2018) -
ESD Failures of GaN-on-Si D-Mode AlGaN/GaN MIS-HEMT and HEMT Devices for 5G Telecommunications
Wu, Wei-Min; Chen, Shih-Hung; Putcha, Vamsi; Peralagu, Uthayasankaran; Sibaja-Hernandez, Arturo; Yadav, Sachin; Parvais, Bertrand; Alian, AliReza; Collaert, Nadine; Ker, Ming-Dou; Groeseneken, Guido (2021) -
ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs
Wu, Wei-Min; Chen, Shih-Hung; Sibaja-Hernandez, Arturo; Yadav, Sachin; Peralagu, Uthayasankaran; Yu, Hao; Alian, AliReza; Putcha, Vamsi; Parvais, Bertrand; Groeseneken, Guido; Ker, M.D.; Collaert, Nadine (2021) -
ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs
Wu, Wei-Min; Ker, Ming-Dou; Chen, Shih-Hung; Sibaja-Hernandez, Arturo; Yadav, Sachin; Peralagu, Uthayasankaran; Yu, Hao; Alian, AliReza; Putcha, Vamsi; Parvais, Bertrand; Collaert, Nadine; Groeseneken, Guido (2022-01-25) -
ESD in FinFET technologies and 3DICs
Chen, Shih-Hung (2015)