Authors

Hellings, Geert; Linten, Dimitri; Thijs, Steven; Chen, Shih-Hung; Witters, Liesbeth; Mitard, Jerome; Zografos, Odysseas; Groeseneken, Guido

Conference

Reliability Center Of Japan Symposium

Title

ESD characterization of high mobility SiGe quantum well and Ge devices for future CMOS scaling

Publication type

Proceedings paper