Browsing by author "Proost, Joris"
Now showing items 21-31 of 31
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On the atomistic details of electromigration-induced drift
Proost, Joris; D'Haen, Jan; Jin, M.; Verlinden, B. (2004) -
Plasticity of electromigration-induced hillocking and how it affects the critical length
Proost, Joris; Maex, Karen; Delaey, L. (2001) -
Plasticity of electromigration-induced hillocking and its effect on the critical length
Proost, Joris; Delaey, L.; D'Haen, Jan; Maex, Karen (2002) -
Rapid thermal anealing of electro chemically plated Cu films
Beyer, Gerald; Kitabijan, P.; Brongersma, Sywert; Proost, Joris; Bender, Hugo; Richard, Emmanuel; Vervoort, Iwan; Hey, P.; Zhang, P.; Maex, Karen (2000) -
Stress relaxation in Al(Cu) thin films
Proost, Joris; Witvrouw, Ann; Cosemans, P.; Roussel, Philippe; Maex, Karen (1997) -
Stress relaxation in Al-Cu and Al-Si-Cu thin films
Witvrouw, Ann; Proost, Joris; Roussel, Philippe; Cosemans, P.; Maex, Karen (1999) -
Stress Relaxation in Al-Si-Cu Thin Films and Lines
Witvrouw, Ann; Proost, Joris; Deweerdt, Bruno; Roussel, Philippe; Maex, Karen (1994) -
Stress relaxation in Al-Si-Cu thin films and lines
Witvrouw, Ann; Proost, Joris; Deweerdt, Bruno; Roussel, Philippe; Maex, Karen (1995) -
Study of Cu diffusion in an Al-1%Si-0.5%Cu bond pad with an Al-1%Si bond wire attached using scanning electron microscopy
Cosemans, P.; D'Haen, Jan; Witvrouw, Ann; Proost, Joris; D'Olieslaeger, Marc; De Ceuninck, Ward; Maex, Karen; De Schepper, Luc (1998) -
The control and impact of processing ambient during RTP
Maex, Karen; Kondoh, Eiichi; Lauwers, Anne; de Potter de ten Broeck, Muriel; Proost, Joris (1998) -
The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)
Proost, Joris; Samajdar, I.; Verlinden, B.; Van Houtte, P.; Maex, Karen; Delaey, L. (1998)