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The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)
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Authors
Proost, Joris
;
Samajdar, I.
;
Verlinden, B.
;
Van Houtte, P.
;
Maex, Karen
;
Delaey, L.
Issue
8
Journal
Scripta Materialia
Volume
39
Title
The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)
Publication type
Journal article
Embargo date
9999-12-31
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