The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)

dc.contributor.author	Proost, Joris
dc.contributor.author	Samajdar, I.
dc.contributor.author	Verlinden, B.
dc.contributor.author	Van Houtte, P.
dc.contributor.author	Maex, Karen
dc.contributor.author	Delaey, L.
dc.contributor.imecauthor	Maex, Karen
dc.date.accessioned	2021-10-01T08:44:27Z
dc.date.available	2021-10-01T08:44:27Z
dc.date.embargo	9999-12-31
dc.date.issued	1998
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/2886
dc.source.beginpage	1039
dc.source.endpage	1045
dc.source.issue	8
dc.source.journal	Scripta Materialia
dc.source.volume	39
dc.title	The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)
dc.type	Journal article
dspace.entity.type	Publication
Files	Original bundle Name: 2753.pdf Size: 401.35 KB Format: Adobe Portable Document Format Download
Publication available in collections:	Articles

Date