Browsing by author "Donaton, R. A."
Now showing items 21-29 of 29
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Mesoscopic SNS junctions on the basis of superconducting PtSi films
Baturina, T. I.; Kvon, Z. D.; Donaton, R. A.; Baklanov, Mikhaïl; Olshanetsky, E. B.; Maex, Karen; Plotnikov, A. E.; Portal, J. C. (2000) -
Microstructural studies of Co silicide layers formed on SiGe and SiGeC
Jin, S.; Bender, Hugo; Donaton, R. A.; Maex, Karen; Vantomme, Andre; Langouche, G.; St. Amour, A.; Sturm, J. C. (1997) -
Microstructural studies of Co silicide layers formed on SiGe and SiGeC
Jin, S.; Bender, Hugo; Donaton, R. A.; Maex, Karen; Vantomme, Andre; Langouche, G.; St. Amour, A.; Sturm, J. C. (1997) -
Process optimization and integration of trimethylsilane deposited a-SiC:H and SiOC:H dielectric thin films for damascene processing
Gray, William; Loboda, M.; Struyf, Herbert; Van Hove, Marleen; Donaton, R. A.; Sleeckx, Erik; Stucchi, Michele; Gao, Teng; Boullart, Werner; Coenegrachts, Bart; Maenhoudt, Mireille; Vanhaelemeersch, Serge; Meynen, Herman; Maex, Karen (2000) -
Properties of mesoscopic S-N-S junctions with perfect N-S interfaces
Kvon, Z. D.; Donaton, R. A.; Baklanov, Mikhaïl; Maex, Karen; Olshanetsky, E. B.; Baturina, T. I.; Plotnikov, A. E.; Portal, J. C. (1998) -
Proximity effects and Andreev reflection in a mesoscopic SNS junction with perfect NS interfaces
Kvon, Z. D.; Baturina, T. I.; Donaton, R. A.; Baklanov, Mikhaïl; Maex, Karen; Olshanetsky, E. B.; Plotnikov, A. E.; Portal, J. C. (2000) -
Simulations and measurements of capacitance in dielectric stacks and consequences for integration
De Roest, David; Donaton, R. A.; Stucchi, Michele; Maex, Karen; Nauwelaers, Bart (2001) -
Simulations and measurements of capacitance in dielectric stacks and consequences for integration
De Roest, David; Donaton, R. A.; Stucchi, Michele; Maex, Karen; Nauwelaers, Bart (2000) -
The influence of Ti capping layers on CoSi2 formation
Detavernier, C.; Van Meirhaeghe, R. L.; Cardon, F.; Donaton, R. A.; Maex, Karen (2000)