Browsing by author "Ronchi, Nicolo"
Now showing items 21-40 of 57
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Fabrication and performance of Au-free AlGaN/GaN-on-Si power devices
Van Hove, Marleen; Kang, Xuanwu; Stoffels, Steve; Wellekens, Dirk; Ronchi, Nicolo; Venegas, Rafael; Geens, Karen; Decoutere, Stefaan (2013) -
Ferroelectric FET with Gd-doped HfO2: A Step Towards Better Uniformity and Improved Memory Performance
Ronchi, Nicolo; Ragnarsson, Lars-Ake; Breuil, Laurent; Banerjee, Kaustuv; McMitchell, Sean; O'Sullivan, Barry; Milenin, Alexey; Kundu, Shreya; Pak, Murat; Van den Bosch, Geert; Van Houdt, Jan (2021) -
Ferroelectric La-Doped ZrO2/HfxZr1-xO2 Bilayer Stacks with Enhanced Endurance
Popovici, Mihaela Ioana; Walke, Amey; Banerjee, Kaustuv; Ronchi, Nicolo; Meersschaut, Johan; Celano, Umberto; McMitchell, Sean; Spampinato, Valentina; Franquet, Alexis; Favia, Paola; Swerts, Johan; Van den Bosch, Geert; Van Houdt, Jan (2021) -
Ferroelectric Switching in FEFET: Physics of the Atomic Mechanism and Switching Dynamics in HfZrOx, HfO2 with Oxygen Vacancies and Si dopants
Clima, Sergiu; O'Sullivan, Barry; Ronchi, Nicolo; Garcia Bardon, Marie; Banerjee, Kaustuv; Van den Bosch, Geert; Pourtois, Geoffrey; Van Houdt, Jan (2020) -
First-principles perspective on poling mechanisms and ferroelectric/ antiferroelectric behavior of Hf1-xZrxO2 for FEFET applications
Clima, Sergiu; McMitchell, Sean; Florent, Karine; Nyns, Laura; Popovici, Mihaela Ioana; Ronchi, Nicolo; Di Piazza, Luca; Van Houdt, Jan; Pourtois, Geoffrey (2018) -
From TCAD device simulation to scalable compact model
Stoffels, Steve; Erlebach, Axel; Tommaso, Cilento; Strauss, Stephan; De Jaeger, Brice; Ronchi, Nicolo; Marcon, Denis; Decoutere, Stefaan (2013-10) -
Impact of AlGaN barrier recess on the DC and dynamic characteristics of AlGaN/GaN Schottky barrier diodes with gated edge termination
Hu, Jie; Stoffels, Steve; Lenci, Silvia; Ronchi, Nicolo; De Jaeger, Brice; You, Shuzhen; Bakeroot, Benoit; Groeseneken, Guido; Decoutere, Stefaan (2016) -
Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO2-Based Ferroelectric FET
Higashi, Yusuke; Ronchi, Nicolo; Kaczer, Ben; Alam, Md Nur Kutubul; O'Sullivan, Barry; Banerjee, Kaustuv; McMitchell, Sean; Breuil, Laurent; Walke, Amey; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2021) -
Impact of charge trapping on imprint and its recovery in HfO2 based FeFET
Higashi, Yusuke; Ronchi, Nicolo; Kaczer, Ben; Banerjee, Kaustuv; McMitchell, Sean; O'Sullivan, Barry; Clima, Sergiu; Minj, Albert; Celano, Umberto; Di Piazza, Luca; Suzuki, Masamichi; Linten, Dimitri; Van Houdt, Jan (2019) -
Impact of interface layer on charge trapping in Si:HfO2 based FeF FT
Jung, Taehwan; O'Sullivan, Barry; Ronchi, Nicolo; Linten, Dimitri; Shin, Changhwan; Van Houdt, Jan (2020) -
Impact of Interface Layer on Device Characteristics of Si:HfO2-Based FeFET's
Jung, Taehwan; O'Sullivan, Barry J.; Ronchi, Nicolo; Linten, Dimitri; Shin, Changhwan; Van Houdt, Jan (2021) -
Impact of mechanical strain on wakeup of HfO2 ferroelectric memory
Kruv, Anastasiia; McMitchell, Sean; Clima, Sergiu; Okudur, Oguzhan Orkut; Ronchi, Nicolo; Van den Bosch, Geert; Gonzalez, Mario; De Wolf, Ingrid; Van Houdt, Jan (2021) -
Impact of Mg out-diffusion and activation on the p-GaN gate HEMT device performance
Posthuma, Niels; You, Shuzhen; Liang, Hu; Ronchi, Nicolo; Kang, Xuanwu; Wellekens, Dirk; Saripalli, Yoga; Decoutere, Stefaan (2016) -
Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors
Wu, Cheng-Hung; Ronchi, Nicolo; Wang, Kuan-Chi; Wang, Yu-Yun; Mcmitchell, Sean; Banerjee, Kaustuv; van den Bosch, Geert; van Houdt, Jan; Wu, Tian-Li (2022) -
Improvement of the dynamic characteristics of Au-free AlGaN/GaN Schottky diodes on 200 mm Si wafers by surface treatments
Lenci, Silvia; Hu, Jie; Van Hove, Marleen; Ronchi, Nicolo; Decoutere, Stefaan (2014) -
Influence of GaN- and Si3N4- passivation layers on the performance of AlGaN/GaN diodes with a gated edge termination
Acurio Mendez, Eliana; Crupi, Felice; De Jaeger, Brice; Ronchi, Nicolo; Bakeroot, Benoit; Decoutere, Stefaan; Trojman, Lionel (2019) -
Investigation of constant voltage off-state stress on Au-free AlGaN/GaN Schottky barrier diodes
Hu, Jie; Stoffels, Steve; Lenci, Silvia; Wu, Tian-Li; Ronchi, Nicolo; You, Shuzhen; Bakeroot, Benoit; Groeseneken, Guido; Decoutere, Stefaan (2015) -
Investigation of imprint in FE-HfO2 and its recovery
Higashi, Yusuke; Kaczer, Ben; Verhulst, Anne; O'Sullivan, Barry; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Di Piazza, Luca; Suzuki, Masamichi; Linten, Dimitri; Van Houdt, Jan (2020) -
Investigation of trapping effects on Au-free AlGaN/GaN Schottky diodes fabricated on C-doped buffer layers
Hu, Jie; Stoffels, Steve; Lenci, Silvia; You, Shuzhen; Bakeroot, Benoit; Ronchi, Nicolo; Venegas, Rafael; Groeseneken, Guido; Decoutere, Stefaan (2015) -
Leakage and trapping characteristics in Au-free AlGaN/GaN Schottky barrier diodes fabricated on C-doped buffer layers
Hu, Jie; Stoffels, Steve; Lenci, Silvia; You, Shuzhen; Bakeroot, Benoit; Ronchi, Nicolo; Groeseneken, Guido; Decoutere, Stefaan (2016)