Browsing by author "De Wolf, Peter"
Now showing items 41-56 of 56
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Practicalities and limitations of scanning capacitance microscopy for routine integrated circuit characterization
Stephenson, Robert; De Wolf, Peter; Trenkler, Thomas; Hantschel, Thomas; Clarysse, Trudo; Jansen, Philippe; Vandervorst, Wilfried (2000) -
Probing semiconductor devices on the nanometer schale
Vandervorst, Wilfried; Clarysse, Trudo; Trenkler, Thomas; Hantschel, Thomas; Eyben, Pierre; Haegeman, Bart; Stephenson, Robert; De Wolf, Peter (1999) -
Quantification of nano-spreading resistance profiling data
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried (1997) -
Quantification of nanospreading resistance profiling data
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried (1998) -
Quantitative carrier profiling of silicon devices by nano-srp
De Wolf, Peter; Clarysse, Trudo; Caymax, Matty; Vandervorst, Wilfried; Snauwaerts, Jan; Hellemans, L. (1996) -
Recent insights in the physical modeling of the spreading resistance point contact
Clarysse, Trudo; De Wolf, Peter; Bender, Hugo; Vandervorst, Wilfried (1995) -
Recent insights in the physical modeling of the spreading resistance point contact
Clarysse, Trudo; De Wolf, Peter; Bender, Hugo; Vandervorst, Wilfried (1996) -
Scanning probe microscopy of 1-D and 2-D carrier distributions
Stephenson, Robert; De Wolf, Peter; Trenkler, Thomas; Hantschel, Thomas; Clarysse, Trudo; Vandervorst, Wilfried (1998) -
Status and review of 2-D carrier profiling using scanning probe microscopy
De Wolf, Peter; Stephenson, Robert; Trenkler, Thomas; Clarysse, Trudo; Hantschel, Thomas; Vandervorst, Wilfried (1999) -
Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy
De Wolf, Peter; Stephenson, Robert; Trenkler, Thomas; Clarysse, Trudo; Hantschel, Thomas; Vandervorst, Wilfried (2000) -
Two-dimensional carrier profiling of InP-based structures using scanning spreading resistance microscopy
De Wolf, Peter; Geva, M.; Reynolds, C. L.; Hantschel, Thomas; Vandervorst, Wilfried; Bylsma, R. B. (1999) -
Two-dimensional carrier profiling of semiconductor structures with nanometer resolution
De Wolf, Peter (1998-05) -
Two-dimensional profiling of InP structures using scanning spreading resistance microscopy
De Wolf, Peter; Geva, M.; Hantschel, Thomas; Vandervorst, Wilfried; Bylsma, R. B. (1998) -
Two-dimensional profiling using scanning spreading resistance microscopy
De Wolf, Peter; Vandervorst, Wilfried; Clarysse, Trudo; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert (1999) -
ULSI-device characterization using conductive scanning probes
Vandervorst, Wilfried; Trenkler, Thomas; De Wolf, Peter; Clarysse, Trudo; Hellemans, L. (1997) -
ULSI-device characterization using nano-SRP
De Wolf, Peter; Trenkler, Thomas; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (1997)