Browsing by author "Taouil, Mottaqiallah"
Now showing items 41-43 of 43
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Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021) -
Using 3D-COSTAR for 2.5D test cost optimization
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan; Bhawmik, Sudipta (2013-10) -
Yield improvement for 3D wafer-to-wafer stacked ICs using wafer matching
Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (2015)