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Yield improvement for 3D wafer-to-wafer stacked ICs using wafer matching
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Authors
Taouil, Mottaqiallah
;
Hamdioui, Said
;
Marinissen, Erik Jan
ISSN
1084-4309
Issue
2
Journal
ACM Transactions on Design Automation of Electronic Systems
Volume
20
Title
Yield improvement for 3D wafer-to-wafer stacked ICs using wafer matching
Publication type
Journal article
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