Browsing by author "Jacobs, Koen"
Now showing items 41-60 of 68
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Laser reflectance monitoring of GaN MOCVD growth
Stafford, A.; Irvine, S. J. C.; Bougrioua, Zahia; Jacobs, Koen; Moerman, Ingrid; Thrush, E.; Considine, L.; Crawley, J. (1999) -
Lateral epitaxial overgrowth for GaN-based LEDs
Jacobs, Koen; Van der Stricht, Wim; Moerman, Ingrid; Demeester, Piet; Thrush, E. J. (1999) -
Material optimisation for AlGaN/GaN HFET applications
Bougrioua, Zahia; Moerman, Ingrid; Sharma, N.; Wallis, R. H.; Cheyns, Jan; Jacobs, Koen; Thrush, E. J.; Considine, L.; Beanland, R.; Farvacque, J. L.; Humphreys, C. (2001) -
Microscale luminescence of ELOG specimens on (0001) sapphire
Amokrane, A.; Dassonneville, S.; Sieber, B.; Jacobs, Koen; Bougrioua, Zahia; Moerman, Ingrid (1999) -
Microstructure and compositional bahviour of InGaN/GaN multiple quantum well structures
Duxbury, N.; Bangert, U.; Shang, P.; Thrush, E. J.; Jacobs, Koen (1999) -
OMVPE-based epitaxial lateral overgrowth for GaN LEDs
Jacobs, Koen; Van der Stricht, Wim; Moerman, Ingrid; Demeester, Piet; De Naeyer, J.; Verstuyft, Steven; Van Daele, Peter; Tricker, D. M.; Amokrane, A.; Dassonneville, S.; Sieber, B.; Thrush, E. J. (1999) -
Optical spectroscopy and composition of GaN
O'Donnell, K. P.; Martin, R. W.; White, M. E.; Jacobs, Koen; Van der Stricht, Wim; Demeester, Piet; Vantomme, Andre; Wu, Ming Fang; Mosselmans, J. F. W. (2000) -
Optical spectroscopy and composition of InGaN
O'Donnell, K. P.; Martin, R. W.; White, M. E.; Jacobs, Koen; Van der Stricht, Wim; Demeester, Piet; Vantomme, Andre; Wu, Ming Fang; Mosselmans, J. F. (1999) -
Photoluminescence mapping and Rutherford backscattering of InGaN epilayers
O'Donnell, K. P.; White, M. E.; Pereira, S.; Wu, Ming Fang; Vantomme, Andre; Van der Stricht, Wim; Jacobs, Koen (1999) -
Photoluminescence mapping and Rutherford backscattering spectrometry of InGaN epilayers
O'Donnell, K. P.; White, M. E.; Pereira, S.; Wu, Ming Fang; Vantomme, Andre; Van der Stricht, Wim; Jacobs, Koen (1999) -
Photoluminescence mapping and Rutherford backscattering spectrometry of InGaN epilayers
O'Donnell, K. P.; White, M. E.; Pereira, S.; Wu, Ming Fang; Vantomme, Andre; Van der Stricht, Wim; Jacobs, Koen; Martin, R. W. (1999) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; Treguer, J. F.; Grimson, S. T. F.; Osborne, I.; Barisonzi, M.; Middleton, P. G.; Manson-Smith, S. K.; Mohammed, A.; O'Donnell, K. P.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid; Demeester, Piet; Wu, Ming Fang; Vantomme, Andre (1999) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; Middleton, P. G.; Mohammed, A.; Manson-Smith, S. K.; Osborne, I.; Barisonzi, M.; O'Donnell, K. P.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid; Demeester, Piet (1999) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; Treguer, J. F.; Grimson, S. T. F.; Osborne, I.; Barisonzi, M.; Middleton, P. G.; Manson-Smith, S. K.; Mohammed, A.; O'Donnell, K. P.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid; Demeester, Piet; Wu, Ming Fang; Vantomme, Andre (1999) -
Purity of an ST Monad Full Abstraction by Semantically Typed Back-Translation
Jacobs, Koen; Devriese, Dominique; Timany, Amin (2022) -
Quantifying the smoothing of GaN epilayer growth by in situ laser interferometry
Stafford, A.; Irvine, S. J. C.; Bougrioua, Zahia; Jacobs, Koen; Moerman, Ingrid; Thrush, E. J.; Considine, L. (2000) -
Quantifying the smoothing of GaN epilayers in MOVPE growth by in-situ laser reflectometry
Stafford, A.; Irvine, S. J. C.; Bougrioua, Zahia; Jacobs, Koen; Moerman, Ingrid; Thrush, E. J.; Considine, L.; Crawley., J. (2000) -
Rutherford backscattering/channeling study of a thin AlGaN layer on Al2O03(0001)
Wu, Ming Fang; Vantomme, Andre; Hogg, S.; Langouche, G.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid (2001) -
Side-wall morphology in reactive ion etching of GaN
Karouta, F.; Jacobs, B.; Jacobs, Koen; Moerman, Ingrid (1999) -
Some considerations on the growth of highly resistive GaN layers
Bougrioua, Zahia; Jacobs, Koen; Cheyns, Jan; Moerman, Ingrid; Thruch, E. J.; Wallis, R. H.; Davies, R. A. (2001)