Browsing by subject "FAILURE"

A framework for combined simulations of electromigration induced stress evolution, void nucleation, and its dynamics: Application to nano-interconnect reliability

Saleh, Ahmed; Croes, Kristof; Ceric, H.; De Wolf, Ingrid; Zahedmanesh, Houman (2023)

Hard Error Correction in STT-MRAM

Hemaram, Surendra; Tahoori, Mehdi B.; Catthoor, Francky; Rao, Siddharth; Couet, Sebastien; Kar, Gouri Sankar (2024)

Reduced Air Leakage During Non-Invasive Ventilation Using a Simple Anesthetic Mask With 3D-Printed Adaptor in an Anthropometric Based Pediatric Head-Lung Model

Hovenier, Renee; Goto, Lye; Huysmans, Toon; van Gestel, Monica; Klein-Blommert, Rozalinde; Markhorst, Dick; Dijkman, Coen; Bem, Reinout A. (2022)

Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits

Zenari, Michele; Buffolo, Matteo; Fornasier, Mirko; De Santi, Carlo; Goyvaerts, Jeroen; Grabowski, Alexander; Gustavsson, Johan; Kumari, Sulakshna; Stassen, Andim; Baets, Roel; Larsson, Anders; Roelkens, Gunther; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo (2023)