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What did you expect? Modelling quality of experience for virtual reality using the repertory grid technique

De Letter, Jolien; Zheleva, Aleksandra; Maes, Mathias; All, Anissa; De Marez, Lieven; Durnez, Wouter (2021)
Physics-based neural network models for prediction of cam-follower dynamics beyond nominal operations

De Groote, W.; Van Hoecke, Sofie; Crevecoeur, G. (2021)
Frozen pretrained transformers for neural sign language translation

De Coster, Mathieu; D'Oosterlinck, Karel; Pizurica, Marija; Rabaey, Paloma; Verlinden, Severine; Van Herreweghe, M.; Dambre, Joni (2021)
Smooth operator : a virtual environment to prototype and analyse operator support in CCTV surveillance rooms

De Bruyne, Jonas; Joundi, Jamil; Morton, Jessica; Van Kets, Niels; Van Wallendael, Glenn; talsma, durk; Saldien, Jelle; De Marez, Lieven; Durnez, Wouter; Bombeke, Klaas (2021)
Chapter Two - Statistical parameter estimation theory: principles and simulation studies

De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert, Sandra (2021)
Chapter Three - Efficient fitting algorithm

De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert, Sandra (2021)
Chapter One - Introduction

De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert, Sandra (2021)
Chapter Four - Atom counting

De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert, Sandra (2021)
Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images

De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert, Sandra (2021)
Chapter Eight - General conclusions and future perspectives

De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert Sandra, (2021)
Scatterometry solutions for 14nm half-pitch BEOL layers patterned by EUV single exposure

Das, Sayantan; Hung, Joey; Halder, Sandip; Koret, Roy; Turovets, Igor; Charley, Anne-Laure; Leray, Philippe (2021)
Secure Fast Evaluation of Iterative Methods: With an Application to Secure PageRank

Cozzo, D; Smart, Nigel P.; Talibi Alaoui, Y. (2021)
BEOL compatible high retention perpendicular SOT-RAM device for SRAM replacement and AiMC

Couet, Sebastien; Rao, Siddharth; Van Beek, Simon; Nguyen, Van Dai; Garello, Kevin; Jayakumar, Ganesh; Costa, Diogo; Cai, Kaiming; Yasin, Farrukh; Crotti, Davide; Kar, Gouri Sankar (2021)
Buried interface and buried film analysis using lab-scale Haxpes instruments

Conard, Thierry; Zborowski, Charlotte; Vanleenhove, Anja; Hoflijk, Ilse; Vaesen, Inge; van der Heide, Paul (2021)
Quantifying the Ru area selective deposition in nanometer confined volumes using RBS

Claessens, Niels; Rahnemaihaghighi, Negin; Delabie, Annelies; Vandervorst, Wilfried; Vantomme, Andre; Meersschaut, Johan (2021)
Probing the surface-chemical species in confined microfluidic devices using RBS.

Claessens, Niels; Couture, Pierre; England, Jonathan; Vos, Rita; Hantschel, Thomas; Vandervorst, Wilfried; Vantomme, Andre; Meersschaut, Johan (2021)
Optical constants for EUV scatterometry

Ciesielski, Richard; Saadeh, Qais; Naujok, Philipp; Opsomer, Karl; Soulie, Jean-Philippe; Wu, Meiyi; Philipsen, Vicky; Van de Kruijs, Robbert; Kolbe, Michael; Scholze, Frank; Soltwisch, Victor (2021)
Persistent photocarrier Accumulation and Depletion in LaAlO3/SrTiO3 Quantum Wells

Chen, Yu; Lechaux, Yoann; Casals, Blai; Guillet, Bruno; Minj, Albert; Sanchez, Florencio; Gázquez, Jaume; Mechin, Laurence; Herranz, Gervasi (2021)
External I/O interfaces in sub-5nm GAA NS Technology and STCO Scaling Options

Chen, Wen Chieh; Chen, Shih-Hung; Hellings, Geert; Bury, Erik; Simicic, Marko; Wu, Zhicheng; Van der Plas, Geert; Beyne, Eric; Groeseneken, Guido (2021)
Next to FinFET, how will ESD suffer?

Chen, Shih-Hung (2021)