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Accurate on-wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device

dc.contributor.authorVerspecht, J.
dc.contributor.authorDebie, Peter
dc.contributor.authorBarel, A.
dc.contributor.authorMartens, Luc
dc.date.accessioned2021-09-29T13:24:45Z
dc.date.available2021-09-29T13:24:45Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1000
dc.sourceIIOimport
dc.titleAccurate on-wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Luc
dc.source.peerreviewno
dc.source.beginpage1029
dc.source.endpage1032
dc.source.conference1995 IEEE MTT-S International Microwave Symposium Digest; 16-20 May 1995; Orlando, FL, USA.
dc.source.conferencelocation
imec.availabilityPublished - imec


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