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Time-of-flight measurements in inhomogeneous electric field

dc.contributor.authorArkhipov, Vladimir
dc.contributor.authorAdriaenssens, Guy
dc.contributor.authorEmelianova, Evguenia
dc.date.accessioned2021-10-16T00:42:55Z
dc.date.available2021-10-16T00:42:55Z
dc.date.issued2005-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10025
dc.sourceIIOimport
dc.titleTime-of-flight measurements in inhomogeneous electric field
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.conference21st International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS 21)
dc.source.conferencedate4/09/2005
dc.source.conferencelocationLisbon Portugal
imec.availabilityPublished - imec


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