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On the scalability of source/drain current enhancement in thin film sSOI

dc.contributor.authorAugendre, Emmanuel
dc.contributor.authorEneman, Geert
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorSimons, Veerle
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorRamos, Javier
dc.contributor.authorBrus, Stephan
dc.contributor.authorPawlak, Bartek
dc.contributor.authorSeveri, Simone
dc.contributor.authorLeys, Frederik
dc.contributor.authorSleeckx, Erik
dc.contributor.authorLocorotondo, Sabrina
dc.contributor.authorErcken, Monique
dc.contributor.authorde Marneffe, Jean-Francois
dc.contributor.authorFei, Lu
dc.contributor.authorSeacrist, Mike
dc.contributor.authorKellerman, Bruce
dc.contributor.authorGoodwin, Michael
dc.contributor.authorJurczak, Gosia
dc.contributor.authorBiesemans, Serge
dc.date.accessioned2021-10-16T00:43:14Z
dc.date.available2021-10-16T00:43:14Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10037
dc.sourceIIOimport
dc.titleOn the scalability of source/drain current enhancement in thin film sSOI
dc.typeProceedings paper
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorSimons, Veerle
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorBrus, Stephan
dc.contributor.imecauthorPawlak, Bartek
dc.contributor.imecauthorSeveri, Simone
dc.contributor.imecauthorSleeckx, Erik
dc.contributor.imecauthorLocorotondo, Sabrina
dc.contributor.imecauthorErcken, Monique
dc.contributor.imecauthorde Marneffe, Jean-Francois
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.contributor.orcidimecSimons, Veerle::0000-0001-5714-955X
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimecSleeckx, Erik::0000-0003-2560-6132
dc.source.peerreviewyes
dc.source.beginpage301
dc.source.endpage304
dc.source.conferenceProceedings of the 35th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate13/09/2005
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


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