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A simulation analysis of FIBL in decananometer double-gate MOSFETs with high-k gate dielectrics
Publication:
A simulation analysis of FIBL in decananometer double-gate MOSFETs with high-k gate dielectrics
Date
2005
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Autran, J.L.
;
Munteanu, D.
;
Bescond, M.
;
Houssa, Michel
;
Said, A.
Journal
Journal of Non-Crystalline Solids
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1922
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1922
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations