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Near-field characterization of SOI photonic crystal structures

dc.contributor.authorBenyattou, T.
dc.contributor.authorOrobtchouk, R.
dc.contributor.authorDumon, Pieter
dc.contributor.authorVan Thourhout, Dries
dc.contributor.authorNeel, D.
dc.date.accessioned2021-10-16T00:45:25Z
dc.date.available2021-10-16T00:45:25Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10084
dc.sourceIIOimport
dc.titleNear-field characterization of SOI photonic crystal structures
dc.typeProceedings paper
dc.contributor.imecauthorVan Thourhout, Dries
dc.contributor.orcidimecVan Thourhout, Dries::0000-0003-0111-431X
dc.source.peerreviewno
dc.source.beginpage98
dc.source.endpage102
dc.source.conferenceProceedings International Conference on Electromagnetic Near-Field Characterization and Imaging - ICONIC
dc.source.conferencedate8/06/2005
dc.source.conferencelocationBarcelona Spain
imec.availabilityPublished - imec
imec.internalnotesISBN 84-95999-72-2


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