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Scaling challenges for sub-45nm technologies

dc.contributor.authorBiesemans, Serge
dc.date.accessioned2021-10-16T00:46:32Z
dc.date.available2021-10-16T00:46:32Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10103
dc.sourceIIOimport
dc.titleScaling challenges for sub-45nm technologies
dc.typeOral presentation
dc.contributor.imecauthorBiesemans, Serge
dc.source.peerreviewno
dc.source.conferenceThe 4th Hiroshima International Workshop on Nanoelectronics for Tera-Bit Information Processing
dc.source.conferencedate16/09/2005
dc.source.conferencelocationHiroshima Japan
imec.availabilityPublished - imec


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