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The impact of scaling on interconnect reliability

dc.contributor.authorBruynseraede, Christophe
dc.contributor.authorTokei, Zsolt
dc.contributor.authorIacopi, Francesca
dc.contributor.authorBeyer, Gerald
dc.contributor.authorMichelon, Julien
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-10-16T00:51:32Z
dc.date.available2021-10-16T00:51:32Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10166
dc.sourceIIOimport
dc.titleThe impact of scaling on interconnect reliability
dc.typeProceedings paper
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.imecauthorBeyer, Gerald
dc.contributor.imecauthorMaex, Karen
dc.source.peerreviewyes
dc.source.beginpage7
dc.source.endpage17
dc.source.conferenceProceedings 43rd IEEE International Reliability Physics Symposium
dc.source.conferencedate17/04/2005
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - imec


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