dc.contributor.author | Bruynseraede, Christophe | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Iacopi, Francesca | |
dc.contributor.author | Beyer, Gerald | |
dc.contributor.author | Michelon, Julien | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-16T00:51:32Z | |
dc.date.available | 2021-10-16T00:51:32Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10166 | |
dc.source | IIOimport | |
dc.title | The impact of scaling on interconnect reliability | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Beyer, Gerald | |
dc.contributor.imecauthor | Maex, Karen | |
dc.source.peerreview | yes | |
dc.source.beginpage | 7 | |
dc.source.endpage | 17 | |
dc.source.conference | Proceedings 43rd IEEE International Reliability Physics Symposium | |
dc.source.conferencedate | 17/04/2005 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - imec | |