dc.contributor.author | Caymax, Matty | |
dc.contributor.author | Delhougne, Romain | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Verheyen, Peter | |
dc.date.accessioned | 2021-10-16T00:54:32Z | |
dc.date.available | 2021-10-16T00:54:32Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10196 | |
dc.source | IIOimport | |
dc.title | Characteristics and integration of selectively grown strain-relaxed SiGe buffer layers | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | Delhougne, Romain | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Verheyen, Peter | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.source.peerreview | no | |
dc.source.conference | 1st International Workshop on New Group IV Semiconductor Nanoelectronics | |
dc.source.conferencedate | 27/05/2005 | |
dc.source.conferencelocation | Sendai Japan | |
imec.availability | Published - imec | |