Publication:

Heavy ion damage in ultra-thin gate oxide SOI MOSFETs

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

2001 since deposited on 2021-10-16
1last month
Acq. date: 2026-04-26

Citations

Statistics

Views

2001 since deposited on 2021-10-16
1last month
Acq. date: 2026-04-26

Citations