Heavy ion damage in ultra-thin gate oxide SOI MOSFETs

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Authors
Cester, A.; Garardin, S.; Paccagnella, A.; Simoen, Eddy; Claeys, Cor; Candelori, A.
Conference
8th European Conference on Radiation and Its Effects on Components and Systems - RADECS
Title
Heavy ion damage in ultra-thin gate oxide SOI MOSFETs
Publication type
Proceedings paper
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