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Speed - accuracy trade-off for measurement and characterization of the matching performance of SiGe:C HBTs, applied to a 200 GHz technology

dc.contributor.authorChoi, Li Jen
dc.contributor.authorVenegas, Rafael
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-16T00:57:05Z
dc.date.available2021-10-16T00:57:05Z
dc.date.issued2005-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10219
dc.sourceIIOimport
dc.titleSpeed - accuracy trade-off for measurement and characterization of the matching performance of SiGe:C HBTs, applied to a 200 GHz technology
dc.typeProceedings paper
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage143
dc.source.endpage148
dc.source.conferenceIEEE International Conference on Microelectronic Test Structures
dc.source.conferencedate4/04/2005
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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