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Low frequency noise as a diagnostic tool for advanced semiconductor material and device characterization

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-16T00:58:46Z
dc.date.available2021-10-16T00:58:46Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10233
dc.sourceIIOimport
dc.titleLow frequency noise as a diagnostic tool for advanced semiconductor material and device characterization
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceICMTS Turorials
dc.source.conferencedate4/04/2005
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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