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dc.contributor.authorDavid, M.L.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorNeimash, V.
dc.contributor.authorKras'ko, M.
dc.contributor.authorKraitchinskii, A.
dc.contributor.authorVoytovych, V.
dc.contributor.authorKabaldin, A.
dc.contributor.authorBarbot, J.F.
dc.date.accessioned2021-10-16T01:05:59Z
dc.date.available2021-10-16T01:05:59Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10286
dc.sourceIIOimport
dc.titleOn the effect of lead on irradiation induced defects in silicon
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage373
dc.source.endpage378
dc.source.conferenceGettering and Defect Engineering in Semiconductor Technology XI. Proceedings of the 11th International Autumn Meeting
dc.source.conferencedate25/09/2005
dc.source.conferencelocationGiens France
imec.availabilityPublished - imec
imec.internalnotesSolid State Phenomena; Vol. 108-109


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