dc.contributor.author | David, M.L. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Neimash, V. | |
dc.contributor.author | Kras'ko, M. | |
dc.contributor.author | Kraitchinskii, A. | |
dc.contributor.author | Voytovych, V. | |
dc.contributor.author | Kabaldin, A. | |
dc.contributor.author | Barbot, J.F. | |
dc.date.accessioned | 2021-10-16T01:05:59Z | |
dc.date.available | 2021-10-16T01:05:59Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10286 | |
dc.source | IIOimport | |
dc.title | On the effect of lead on irradiation induced defects in silicon | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.beginpage | 373 | |
dc.source.endpage | 378 | |
dc.source.conference | Gettering and Defect Engineering in Semiconductor Technology XI. Proceedings of the 11th International Autumn Meeting | |
dc.source.conferencedate | 25/09/2005 | |
dc.source.conferencelocation | Giens France | |
imec.availability | Published - imec | |
imec.internalnotes | Solid State Phenomena; Vol. 108-109 | |