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dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorCzarnecki, Piotr
dc.contributor.authorJourdain, Anne
dc.contributor.authorKalicinski, Stanislaw
dc.contributor.authorModlinski, Robert
dc.contributor.authorMuller, Philippe
dc.contributor.authorRottenberg, Xavier
dc.contributor.authorSoussan, Philippe
dc.contributor.authorTilmans, Harrie
dc.date.accessioned2021-10-16T01:13:55Z
dc.date.available2021-10-16T01:13:55Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10337
dc.sourceIIOimport
dc.titleFailure mechanisms and reliability issues of RF-MEMS switches
dc.typeProceedings paper
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorCzarnecki, Piotr
dc.contributor.imecauthorJourdain, Anne
dc.contributor.imecauthorMuller, Philippe
dc.contributor.imecauthorRottenberg, Xavier
dc.contributor.imecauthorSoussan, Philippe
dc.contributor.imecauthorTilmans, Harrie
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimecSoussan, Philippe::0000-0002-1347-6978
dc.contributor.orcidimecTilmans, Harrie::0000-0003-4240-4962
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference5th ESA-ESTEC Round Table on Micro/Nano Technologies for Space
dc.source.conferencedate3/10/2005
dc.source.conferencelocationNoordwijk The Netherlands
imec.availabilityPublished - open access
imec.internalnotesESA WPP 255 (CD-ROM)


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