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From micro breakdown to hard breakdown - from artifact to destructive failure?

dc.contributor.authorDegraeve, Robin
dc.date.accessioned2021-10-16T01:16:52Z
dc.date.available2021-10-16T01:16:52Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10356
dc.sourceIIOimport
dc.titleFrom micro breakdown to hard breakdown - from artifact to destructive failure?
dc.typeMeeting abstract
dc.contributor.imecauthorDegraeve, Robin
dc.source.peerreviewno
dc.source.beginpage141
dc.source.conferenceIEEE International Integrated Reliability Workshop: Final Report
dc.source.conferencedate17/10/2005
dc.source.conferencelocationLake Tahoe, CA USA
imec.availabilityPublished - imec
imec.internalnotesTutorial abstract


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