Layout impact on the performance of a locally strained PMOSFET

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Authors
Eneman, Geert; Verheyen, Peter; Rooyackers, Rita; Nouri, Faran; Washington, Lori; Degraeve, Robin; Kaczer, Ben; Moroz, Victor; De Keersgieter, An; Schreutelkamp, Rob; Kawaguchi, M.; Kim, Y.; Samoilov, A.; Smith, L.; Absil, Philippe; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge
Conference
Symposium on VLSI Technology. Digest of Technical Papers
Title
Layout impact on the performance of a locally strained PMOSFET
Publication type
Proceedings paper
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