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Temperature and oxide tickness influence on the generation lifetime determination in partially depleted SOI nMOSFETs
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Authors
Galeti, M.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Conference
Proceedings SBMicro: 20th Symposium on Microelectronics Technology and Devices
Title
Temperature and oxide tickness influence on the generation lifetime determination in partially depleted SOI nMOSFETs
Publication type
Proceedings paper
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