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dc.contributor.authorGoux, Ludovic
dc.contributor.authorRusso, G.
dc.contributor.authorLisoni, Judit
dc.contributor.authorSchwitters, Michael
dc.contributor.authorParaschiv, Vasile
dc.contributor.authorMaes, David
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorWouters, Dirk
dc.contributor.authorZambrano, R.
dc.date.accessioned2021-10-16T01:48:27Z
dc.date.available2021-10-16T01:48:27Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10519
dc.sourceIIOimport
dc.titleExcellent reliability properties of 0.81mm2 integrated SBT fecap's with 3-D structure
dc.typeOral presentation
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorParaschiv, Vasile
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewno
dc.source.conference7th International Symposium on Integrated Ferroelectrics
dc.source.conferencedate15/04/2005
dc.source.conferencelocationShanghai China
imec.availabilityPublished - imec


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