dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Russo, G. | |
dc.contributor.author | Lisoni, Judit | |
dc.contributor.author | Schwitters, Michael | |
dc.contributor.author | Paraschiv, Vasile | |
dc.contributor.author | Maes, David | |
dc.contributor.author | Haspeslagh, Luc | |
dc.contributor.author | Wouters, Dirk | |
dc.contributor.author | Zambrano, R. | |
dc.date.accessioned | 2021-10-16T01:48:27Z | |
dc.date.available | 2021-10-16T01:48:27Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10519 | |
dc.source | IIOimport | |
dc.title | Excellent reliability properties of 0.81mm2 integrated SBT fecap's with 3-D structure | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.imecauthor | Paraschiv, Vasile | |
dc.contributor.imecauthor | Haspeslagh, Luc | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.source.peerreview | no | |
dc.source.conference | 7th International Symposium on Integrated Ferroelectrics | |
dc.source.conferencedate | 15/04/2005 | |
dc.source.conferencelocation | Shanghai China | |
imec.availability | Published - imec | |