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dc.contributor.authorGoux, Ludovic
dc.contributor.authorRusso, G.
dc.contributor.authorMenou, N.
dc.contributor.authorLisoni, Judit
dc.contributor.authorSchwitters, M.
dc.contributor.authorParaschiv, Vasile
dc.contributor.authorMaes, David
dc.contributor.authorArtoni, C.
dc.contributor.authorCorallo, G.
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorWouters, Dirk
dc.contributor.authorZambrano, R.
dc.contributor.authorMuller, Ch.
dc.date.accessioned2021-10-16T01:48:42Z
dc.date.available2021-10-16T01:48:42Z
dc.date.issued2005-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10520
dc.sourceIIOimport
dc.titleA highly reliable 3-dimensional integrated SBT ferroelectric capacitor enabling FeRAM scaling
dc.typeJournal article
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorParaschiv, Vasile
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewno
dc.source.beginpage447
dc.source.endpage453
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue4
dc.source.volume52
imec.availabilityPublished - imec


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