dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Russo, G. | |
dc.contributor.author | Menou, N. | |
dc.contributor.author | Lisoni, Judit | |
dc.contributor.author | Schwitters, M. | |
dc.contributor.author | Paraschiv, Vasile | |
dc.contributor.author | Maes, David | |
dc.contributor.author | Artoni, C. | |
dc.contributor.author | Corallo, G. | |
dc.contributor.author | Haspeslagh, Luc | |
dc.contributor.author | Wouters, Dirk | |
dc.contributor.author | Zambrano, R. | |
dc.contributor.author | Muller, Ch. | |
dc.date.accessioned | 2021-10-16T01:48:42Z | |
dc.date.available | 2021-10-16T01:48:42Z | |
dc.date.issued | 2005-04 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10520 | |
dc.source | IIOimport | |
dc.title | A highly reliable 3-dimensional integrated SBT ferroelectric capacitor enabling FeRAM scaling | |
dc.type | Journal article | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.imecauthor | Paraschiv, Vasile | |
dc.contributor.imecauthor | Haspeslagh, Luc | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.source.peerreview | no | |
dc.source.beginpage | 447 | |
dc.source.endpage | 453 | |
dc.source.journal | IEEE Trans. Electron Devices | |
dc.source.issue | 4 | |
dc.source.volume | 52 | |
imec.availability | Published - imec | |