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Recent trends in reliability assessment of advanced CMOS technologies

dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.authorRoussel, Philippe
dc.date.accessioned2021-10-16T01:49:55Z
dc.date.available2021-10-16T01:49:55Z
dc.date.issued2005-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10526
dc.sourceIIOimport
dc.titleRecent trends in reliability assessment of advanced CMOS technologies
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewno
dc.source.beginpage81
dc.source.endpage88
dc.source.conferenceIEEE Proceedings of the International Conference on Microelectronic Test Structures
dc.source.conferencedate4/04/2005
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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