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A yield-aware modeling methodology for nano-scaled SRAM designs

dc.contributor.authorGrossar, Evelyn
dc.contributor.authorCroon, Jeroen
dc.contributor.authorStucchi, Michele
dc.contributor.authorDehaene, Wim
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-10-16T01:50:58Z
dc.date.available2021-10-16T01:50:58Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10531
dc.sourceIIOimport
dc.titleA yield-aware modeling methodology for nano-scaled SRAM designs
dc.typeProceedings paper
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorDehaene, Wim
dc.contributor.imecauthorMaex, Karen
dc.source.peerreviewno
dc.source.beginpage33
dc.source.endpage36
dc.source.conferenceInternational Conference on Integrated Circuit Design & Technology
dc.source.conferencedate9/05/2005
dc.source.conferencelocationAustin, TX USA
imec.availabilityPublished - imec


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