dc.contributor.author | Hayama, K. | |
dc.contributor.author | Takakura, K. | |
dc.contributor.author | Ohyama, H. | |
dc.contributor.author | Rafi, J.M. | |
dc.contributor.author | Mercha, Abdelkarim | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-16T01:55:14Z | |
dc.date.available | 2021-10-16T01:55:14Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10550 | |
dc.source | IIOimport | |
dc.title | Degradation of drain current hysteresis in electron-irradiated FD-SOI MOSFETs in accumulation mode operation | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Mercha, Abdelkarim | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.conference | Proceedings of the International Conference on Electrical Engineering - ICEE | |
dc.source.conferencedate | 10/07/2005 | |
dc.source.conferencelocation | Kumning China | |
imec.availability | Published - imec | |