Publication:
Difference of 2-MeV electron-irradiation-induced performance degradation in FD-SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers
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1914 since deposited on 2021-10-16
1last month
Acq. date: 2026-04-06
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Views
1914 since deposited on 2021-10-16
1last month
Acq. date: 2026-04-06
Citations