Publication:
Difference of 2-MeV electron-irradiation-induced performance degradation in FD-SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers
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1911 since deposited on 2021-10-16
Acq. date: 2025-10-25
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1911 since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations