dc.contributor.author | Hendrickx, Eric | |
dc.contributor.author | Torres, Andres | |
dc.contributor.author | Lafferty, Neal | |
dc.contributor.author | Le Cam, Laurent | |
dc.contributor.author | Johnson, Stephen | |
dc.contributor.author | Reita, Carlo | |
dc.contributor.author | Vandenberghe, Geert | |
dc.contributor.author | Maurer, Wilhelm | |
dc.date.accessioned | 2021-10-16T01:59:45Z | |
dc.date.available | 2021-10-16T01:59:45Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10570 | |
dc.source | IIOimport | |
dc.title | Complementary dipole exposure solutions at 0.29k1 | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Hendrickx, Eric | |
dc.contributor.imecauthor | Vandenberghe, Geert | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 327 | |
dc.source.endpage | 338 | |
dc.source.conference | Optical Microlithography XVIII | |
dc.source.conferencedate | 27/02/2005 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings of SPIE; Vol. 5754 | |