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dc.contributor.authorJansen, Philippe
dc.contributor.authorThijs, Steven
dc.contributor.authorLinten, Dimitri
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorVassilev, Vesselin
dc.contributor.authorLiu, Mingxu
dc.contributor.authorConcannon, A.
dc.contributor.authorTremouilles, David
dc.contributor.authorNakaie, T.
dc.contributor.authorSawada, M.
dc.contributor.authorVashchenko, V.
dc.contributor.authorter Beek, M.
dc.contributor.authorHasebe, T.
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T02:18:22Z
dc.date.available2021-10-16T02:18:22Z
dc.date.issued2005-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10643
dc.sourceIIOimport
dc.titleRF ESD protection strategies - the design and performance trade-off challenges
dc.typeProceedings paper
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorLiu, Mingxu
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage489
dc.source.endpage496
dc.source.conferenceProceedings of the IEEE Custom Integrated Circuits Conference
dc.source.conferencedate18/09/2005
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - imec


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