Show simple item record

RFCV test structures for a selected frequency range

dc.contributor.authorJeamsaksiri, Wutthinan
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorRamos, Javier
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorCubaynes, Florence
dc.date.accessioned2021-10-16T02:20:17Z
dc.date.available2021-10-16T02:20:17Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10650
dc.sourceIIOimport
dc.titleRFCV test structures for a selected frequency range
dc.typeJournal article
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage817
dc.source.endpage823
dc.source.journalIEICE Transactions on Electronics
dc.source.issue5
dc.source.volume88
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record