RFCV test structures for a selected frequency range

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Authors

Jeamsaksiri, Wutthinan; Mercha, Abdelkarim; Ramos, Javier; Decoutere, Stefaan; Cubaynes, Florence

Issue

5

Journal

IEICE Transactions on Electronics

Volume

88

Title

RFCV test structures for a selected frequency range

Publication type

Journal article

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