Publication:
RFCV test structures for a selected frequency range
Date
| dc.contributor.author | Jeamsaksiri, Wutthinan | |
| dc.contributor.author | Mercha, Abdelkarim | |
| dc.contributor.author | Ramos, Javier | |
| dc.contributor.author | Decoutere, Stefaan | |
| dc.contributor.author | Cubaynes, Florence | |
| dc.contributor.imecauthor | Mercha, Abdelkarim | |
| dc.contributor.imecauthor | Decoutere, Stefaan | |
| dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
| dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
| dc.date.accessioned | 2021-10-16T02:20:17Z | |
| dc.date.available | 2021-10-16T02:20:17Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10650 | |
| dc.source.beginpage | 817 | |
| dc.source.endpage | 823 | |
| dc.source.issue | 5 | |
| dc.source.journal | IEICE Transactions on Electronics | |
| dc.source.volume | 88 | |
| dc.title | RFCV test structures for a selected frequency range | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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