Show simple item record

Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification

dc.contributor.authorKaczer, Ben
dc.contributor.authorArkhipov, Vladimir
dc.contributor.authorDegraeve, Robin
dc.contributor.authorCollaert, Nadine
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorGoodwin, Michael
dc.date.accessioned2021-10-16T02:24:38Z
dc.date.available2021-10-16T02:24:38Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10668
dc.sourceIIOimport
dc.titleDisorder-controlled-kinetics model for negative bias temperature instability and its experimental verification
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewno
dc.source.beginpage381
dc.source.endpage387
dc.source.conferenceProceedings 43rd Annual IEEE International Reliability Physics Symposium
dc.source.conferencedate17/04/2005
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record