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Impact of LER and CDU on device performance

dc.contributor.authorLeunissen, Peter
dc.contributor.authorLorusso, Gian
dc.contributor.authorErcken, Monique
dc.contributor.authorCroon, Jeroen
dc.contributor.authorJurczak, Gosia
dc.contributor.authorZhang, Wenqi
dc.contributor.authorWu, W.
dc.contributor.authorYang, H.
dc.contributor.authorAzordegan, A.
dc.contributor.authorDiBiase, T.
dc.date.accessioned2021-10-16T02:53:31Z
dc.date.available2021-10-16T02:53:31Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10774
dc.sourceIIOimport
dc.titleImpact of LER and CDU on device performance
dc.typeProceedings paper
dc.contributor.imecauthorLorusso, Gian
dc.contributor.imecauthorErcken, Monique
dc.contributor.imecauthorJurczak, Gosia
dc.source.peerreviewno
dc.source.conferenceYield Management Solutions Seminar
dc.source.conferencedate15/08/2005
dc.source.conferencelocationTaiwan Hsinchu
imec.availabilityPublished - imec


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