dc.contributor.author | Li, Yunlong | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-16T02:55:31Z | |
dc.date.available | 2021-10-16T02:55:31Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10781 | |
dc.source | IIOimport | |
dc.title | Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Li, Yunlong | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Maex, Karen | |
dc.contributor.orcidimec | Li, Yunlong::0000-0003-4791-4013 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1299 | |
dc.source.endpage | 1304 | |
dc.source.conference | Proceedings of the 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF | |
dc.source.conferencedate | 10/10/2005 | |
dc.source.conferencelocation | Arcachon France | |
imec.availability | Published - open access | |