Authors

Lujan, Guilherme; Magnus, Wim; Soree, Bart; Ragnarsson, Lars-Ake; Trojman, Lionel; Kubicek, Stefan; De Gendt, Stefan; Heyns, Marc; De Meyer, Kristin

Journal

Microelectronic Engineering

Volume

80

Title

Barrier permeation effects on the inversion layer subband structure and its applications to the electron mobility

Publication type

Journal article