Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors

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Authors
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Lokshin, M.; Lee, Shih Chung; Simoen, Eddy; Claeys, Cor
Conference
Noise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF
Title
Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors
Publication type
Proceedings paper
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