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Origin of the front-back gate coupling in partially depleted and fully depleted silicon-on-insulator metal-oxide-semiconductor field-effect transistors with accumulated back gate
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Origin of the front-back gate coupling in partially depleted and fully depleted silicon-on-insulator metal-oxide-semiconductor field-effect transistors with accumulated back gate
Date
2005
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N.
;
Garbar, N.
;
Smolanka, A.
;
Lokshin, M.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Journal of Applied Physics
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1899
since deposited on 2021-10-16
Acq. date: 2025-10-28
Citations
Metrics
Views
1899
since deposited on 2021-10-16
Acq. date: 2025-10-28
Citations