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RFCMOS ESD protection and reliability

dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThijs, Steven
dc.contributor.authorJansen, Philippe
dc.contributor.authorTremouilles, David
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T03:11:30Z
dc.date.available2021-10-16T03:11:30Z
dc.date.issued2005-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10833
dc.sourceIIOimport
dc.titleRFCMOS ESD protection and reliability
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage59
dc.source.endpage66
dc.source.conferenceProceedings IEEE Internation Symposium on Physical and Failure Analysis - IPFA
dc.source.conferencedate27/06/2005
dc.source.conferencelocationSingapore Singapore
imec.availabilityPublished - imec


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