Impact of CMOS Scaling and Technology Options on ESD Reliability

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Authors
Mahadeva Iyer, Natarajan; Thijs, Steven; Vassilev, Vesselin; Tremouilles, David; Linten, Dimitri; Groeseneken, Guido
Conference
MRS International Conference on Advanced Materials (IUMRS-ICAM)
Title
Impact of CMOS Scaling and Technology Options on ESD Reliability
Publication type
Oral presentation
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