dc.contributor.author | Martinez, F. | |
dc.contributor.author | Laigle, A. | |
dc.contributor.author | Hoffmann, A. | |
dc.contributor.author | Valenza, M. | |
dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Jurczak, Gosia | |
dc.date.accessioned | 2021-10-16T03:20:50Z | |
dc.date.available | 2021-10-16T03:20:50Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10867 | |
dc.source | IIOimport | |
dc.title | Contributions of channel gate and overlap gate currents on 1/f gate current noise for thin gate oxide p-MOSFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.source.peerreview | no | |
dc.source.beginpage | 243 | |
dc.source.endpage | 246 | |
dc.source.conference | Noise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF | |
dc.source.conferencedate | 19/09/2005 | |
dc.source.conferencelocation | Salamanca Spain | |
imec.availability | Published - imec | |
imec.internalnotes | AIP Conference Proceedings; Vol. 780 | |